JCET said it has achieved a significant advance in high-aspect-ratio through-silicon via (TSV) technology and, with partners, completed sample fabrication. The TSV process targets 2.5D/3D advanced packaging, silicon interconnects and heterogeneous integration, intended to strengthen JCET’s microsystem integration process capabilities and provide one-stop manufacturing support for system-level integration of high-compute, high-memory chips.

2026-08-19

JCET said it has achieved a significant advance in high-aspect-ratio through-silicon via (TSV) technology and, with partners, completed sample fabrication. The TSV process targets 2.5D/3D advanced packaging, silicon interconnects and heterogeneous integration, intended to strengthen JCET’s microsystem integration process capabilities and provide one-stop manufacturing support for system-level integration of high-compute, high-memory chips.